Transient laser thermal conductivity analyzer, flash method Diffusivity measuring instrument

Model No.: TCM-LF-I

This instrument is suitable for measuring the thermal diffusivity and thermal conductivity of solid materials with high thermal conductivity, such as metal, graphite, graphene, silicon carbide, etc.

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Product info

Overview

This instrument is suitable for measuring the thermal diffusivity and thermal conductivity of solid materials with high thermal conductivity, such as metal, graphite, graphene, silicon carbide, etc.

Standard

ASTM E1461--2001 "Test for Determination of Thermal Diffusivity by Flash Method"
National standard "Measurement of Thermal Diffusivity or Thermal Conductivity by Flash Method"

Testing principle

A thin sample is irradiated by a high-intensity short-time energy pulse. The front side of the sample absorbs the pulse energy to increase the temperature on the back side.

The temperature change on the back side is recorded. After receiving the light pulse irradiation, the temperature on the back side of the sample rises to half of the maximum value. time (also called half-heating time), and use a computer to quickly calculate its thermal diffusion coefficient and thermal conductivity through a special mathematical model.

Main technical parameters

MODEL	TCM-LF-I
Sample size range	Φ12 × (0.1-5)mm Square = 10x10mm Thickness 1~3mm
Thermal conductivity measurement range	0.1~2000 w/m.k
resolution	0.1w/m.k
Analysis	Multiple thermal parameters such as thermal diffusion coefficient (thermal conductivity coefficient) and specific heat capacity at the same time;
Laser source power	200W adjustable
Test accuracy	±3%
Repeatability	< ± 3%
Computer & Software	Fully automatic testing software to quickly and accurately conduct test process parameter analysis and report output on samples;
Power supply	AC 220V±10%; 50~60Hz
Power	500W