Transient laser thermal conductivity analyzer, flash method Diffusivity measuring instrument
TCM-LF-I
This instrument is suitable for measuring the thermal diffusivity and thermal conductivity of solid materials with high thermal conductivity, such as metal, graphite, graphene, silicon carbide, etc.
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Product info
Overview
This instrument is suitable for measuring the thermal diffusivity and thermal conductivity of solid materials with high thermal conductivity, such as metal, graphite, graphene, silicon carbide, etc.
Standard
- ASTM E1461--2001 "Test for Determination of Thermal Diffusivity by Flash Method"
- National standard "Measurement of Thermal Diffusivity or Thermal Conductivity by Flash Method"
Testing principle
A thin sample is irradiated by a high-intensity short-time energy pulse. The front side of the sample absorbs the pulse energy to increase the temperature on the back side.
The temperature change on the back side is recorded. After receiving the light pulse irradiation, the temperature on the back side of the sample rises to half of the maximum value. time (also called half-heating time), and use a computer to quickly calculate its thermal diffusion coefficient and thermal conductivity through a special mathematical model.
Main technical parameters
MODEL | TCM-LF-I |
Sample size range |
|
Thermal conductivity measurement range | 0.1~2000 w/m.k |
resolution | 0.1w/m.k |
Analysis | Multiple thermal parameters such as thermal diffusion coefficient (thermal conductivity coefficient) and specific heat capacity at the same time; |
Laser source power | 200W adjustable |
Test accuracy | ±3% |
Repeatability | < ± 3% |
Computer & Software | Fully automatic testing software to quickly and accurately conduct test process parameter analysis and report output on samples; |
Power supply | AC 220V±10%; 50~60Hz |
Power | 500W |
