Advantage
SEM8000F field emission scanning electron microscope
◆ Schottky Schottky field emission electron gun of high brightness, good single color,small electron beam spot size, long life
◆Low acceleration voltage to maintain good brightness and higher resolution
◆ High beam stability, the dispersion is small, suitable for a variety of long accurate analysis, such as BSE, EDS, EBSD
◆ Low acceleration voltage of non-conductive samples can be directly observed without spraying
◆ Variety of automatic functions, operation is very simple, using only the mouse to complete all of the electron microscope operation
Parameter
| Model |
SEM8000F |
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Resolution |
1.5 nm(15KV); 5nm(3KV) |
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Magnification |
15x~500,000x |
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Acceleration voltage |
0 ~ 30KV |
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Electron gun |
Schottky Schottky field emission electron gun |
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Automatic adjustment function |
Focus, brightness / contrast, eliminate astigmatism of the electron beam on the medium |
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Vacuum System |
High-vacuum secondary electron detector (detector probe is not equipped with protective function of collision) |
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Stroke |
X |
0 ~ 80mm |
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Y |
0 ~ 60mm |
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Z |
0 ~ 50mm |
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R |
360° |
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T |
-5° ~ 90° |
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Detector |
SE detector, BSE detector (optional), X-ray energy dispersive spectroscopy (optional), EBSD (optional) |
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