SEM6200 Series Scanning Electron Microscope (Tungsten filament)

Product description:
       ◇ Affordable
       ◇ English interface, with one key imaging function
       ◇ Automatic adjustment function: electron gun heating, bias, alignment, focus, brightness, contrast, dissipate degree, astigmatism and other memories
       ◇ Llow maintenance and repair costs

Application

•  Materials Science
•  Life Sciences
•  Petrochemical
•  Criminal Identification
•  Mineral Research
•  Metal material
•  PM
•  Thin Films
• Functional ceramics
•  Textile fibers

 

 
Gesneriaceae pollen                                        zinc oxide

Instant noodles section                                    Monolithic silica column

Ammonium molybdate                Diatom                             Graphite

Zinc oxide                  Failure screw                          Ant

Solder Ball                        Carbon spray                    Soft magnetic alloy

Cement                              CNT(carbon nano tube)                    Active carbon

Scanning Electron Microscopy (SEM) Basic Working Principle

• Electron gun emits a steady electron beam;
• Electron beam through an electromagnetic lens system forms a fine beam spot on the sample surface;
• Incident electron interacts with the sample, can stimulate secondary electrons, backscattered electrons, X-rays and other signals;
• Scanning electron beam under the control of the magnetic field ,on the surface of the sample point by point progressive scanning;
• Use of the detector receiving the signal, amplifies, Sample surface image can be formed after collection., thus reflecting the sample surface topography, composition and other information.

Energy spectrum probe           Energy spectrum

Features:

• The new control system, one key look image functions, improve the application experience
• Automatic electronic gun heat, automatic bias, self-centering, auto focus, auto brightness, auto contrast
• Automatically eliminate astigmatism, automatic astigmatism memory and so on.
• Automatic calibration, automatic fault detection
• TV mode
• Molecular pump vacuum system
• Three Characteristics
• Stable and reliable
• control system finished by collaboration with the United States
• Convenient operation, English interface

• Affordable, low purchase price, low maintenance costs

              

Model		SEM6200	SEM6200Z
Resolution		4.5nm (30KV)
Magnification;		15x ~ 250,000x
Type electron gun		Hair Fork tungsten cathode
Acceleration voltage		0 ~ 30KV
Lens system		Three electromagnetic lens
Lens aperture		Three diaphragm can be selected to adjust the vacuum outside
Sample stage		Manual	X / Y automatic station
Stroke	X	0 ~ 50mm（big sample stage 0-80mm)
	Y	0 ~ 50mm
	Z	0 ~ 25mm(big sample stage 0-30mm)
	R	360°
				T	-5° ~ 90°(big sample stage 0°-90°）
	Detector		Secondary electron detector element, backscattered electron detector (optional), X-ray energy dispersive spectroscopy (optional)
Vacuum system		Molecular pump (diffusible molecular pump)