SEM6900 Series
SEM6900 electron microscopy, using international advanced technology to optimize the design of the electron optical column, using a conical lens to improve the resolution of the instrument, open-type electron gun, user-friendly replacement of the filament; with a new electrical control system, and have a number of automatic operating functions (eg: a key look like),
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Product description:
SEM6900 electron microscopy, using international advanced technology to optimize the design of the electron optical column, using a conical lens to improve the resolution of the instrument, open-type electron gun, user-friendly replacement of the filament; with a new electrical control system, and have a number of automatic operating functions (eg: a key look like), a plurality of interface is suitable for connecting a variety of accessories for your device, programmable gain bandwidth, is a high-performance scanning electron microscopy, to provide users with a broader field of application development.
◇ High resolution and higher image quality
◇ Pivotal hair fork structure tungsten cathode
◇ English interface, with a key imaging function
◇Automatic adjustment function: electron gun heating, bias, alignment, focus, brightness, contrast, dissipate degree, astigmatism and other memories
◇Automatic calibration, automatic fault detection
◇ Low maintenance and repair costs
Model | SEM6900 | SEM6900Z | |
Resolution | 3.0nm (30KV) | ||
6x ~ 300,000x | |||
Type electron gun | Pivotal hair fork structure tungsten cathode | ||
Acceleration voltage | 0 ~ 30KV | ||
Lens system | Three electromagnetic lens (objective lens cone) | ||
Lens aperture | Three diaphragm can be selected to adjust the vacuum outside | ||
Sample stage | Manual | X / Y axis auto | |
Stroke | X | 0 ~ 80mm | |
Y | 0 ~ 60mm | ||
Z | 0 ~ 50mm | ||
R | 360° | ||
T | -5° ~ 90° | ||
Detector | SE detector, BSE detector (optional), X-ray energy dispersive spectroscopy (optional), EBSD (optional) | ||
Vacuum system | Molecular pump |