Field Emission Scanning Electron Microscope

SEM8000F

Advantage
SEM8000F field emission scanning electron microscope
◆ Schottky Schottky field emission electron gun of high brightness, good single color,small electron beam spot size, long life
◆Low acceleration voltage to maintain good brightness and higher resolution
◆ High beam stability, the dispersion is small, suitable for a variety of long accurate analysis, such as BSE, EDS, EBSD

More details

Product info

Advantage
SEM8000F field emission scanning electron microscope
◆ Schottky Schottky field emission electron gun of high brightness, good single color,small electron beam spot size, long life
◆Low acceleration voltage to maintain good brightness and higher resolution
◆ High beam stability, the dispersion is small, suitable for a variety of long accurate analysis, such as BSE, EDS, EBSD
◆ Low acceleration voltage of non-conductive samples can be directly observed without spraying
◆ Variety of automatic functions, operation is very simple, using only the mouse to complete all of the electron microscope operation
 
Parameter


Model

SEM8000F

Resolution

1.5 nm(15KV); 5nm(3KV)

Magnification

15x~500,000x

Acceleration voltage

0 ~ 30KV

Electron gun

Schottky Schottky field emission electron gun

Automatic adjustment function

Focus, brightness / contrast, eliminate astigmatism of the electron beam on the medium

Vacuum System

High-vacuum secondary electron detector (detector probe is not equipped with protective function of collision)

Stroke

X

0 ~ 80mm

Y

0 ~ 60mm

Z

0 ~ 50mm

R

360°

T

-5° ~ 90°

Detector

SE detector, BSE detector (optional), X-ray energy dispersive spectroscopy (optional), EBSD (optional)