Field Emission Scanning Electron Microscope
SEM8000F
Advantage
SEM8000F field emission scanning electron microscope
◆ Schottky Schottky field emission electron gun of high brightness, good single color,small electron beam spot size, long life
◆Low acceleration voltage to maintain good brightness and higher resolution
◆ High beam stability, the dispersion is small, suitable for a variety of long accurate analysis, such as BSE, EDS, EBSD
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Product info
Advantage
SEM8000F field emission scanning electron microscope
◆ Schottky Schottky field emission electron gun of high brightness, good single color,small electron beam spot size, long life
◆Low acceleration voltage to maintain good brightness and higher resolution
◆ High beam stability, the dispersion is small, suitable for a variety of long accurate analysis, such as BSE, EDS, EBSD
◆ Low acceleration voltage of non-conductive samples can be directly observed without spraying
◆ Variety of automatic functions, operation is very simple, using only the mouse to complete all of the electron microscope operation
Parameter
Model | SEM8000F | |
Resolution | 1.5 nm(15KV); 5nm(3KV) | |
Magnification | 15x~500,000x | |
Acceleration voltage | 0 ~ 30KV | |
Electron gun | Schottky Schottky field emission electron gun | |
Automatic adjustment function | Focus, brightness / contrast, eliminate astigmatism of the electron beam on the medium | |
Vacuum System | High-vacuum secondary electron detector (detector probe is not equipped with protective function of collision) | |
Stroke | X | 0 ~ 80mm |
Y | 0 ~ 60mm | |
Z | 0 ~ 50mm | |
R | 360° | |
T | -5° ~ 90° | |
Detector | SE detector, BSE detector (optional), X-ray energy dispersive spectroscopy (optional), EBSD (optional) | |